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Periodical
Surfaces and interfaces.
ISSN: 24680230 Year: 2016 Publisher: [Amsterdam] : Elsevier B.V.,

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Periodical
Tribology in industry.
Author:
ISSN: 03548996 22177965 Year: 1997 Publisher: Kragujevac, Serbia : Faculty of Engineering, University of Kragujevac

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Scanning force microscopy : with applications to electric, magnetic, and atomic forces
Author:
ISBN: 128044178X 0198022816 9786610441785 0195344693 1602566283 9780198022817 9780195092042 019509204X 019509204X 0197732615 Year: 2023 Publisher: New York ; Oxford University Press,

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Includes information about the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. This book also includes research in SFM and a bibliography. It will be useful for academic and industrial researchers using SFM.


Periodical
Advances in tribology.
ISSN: 16875915 16875923 Year: 2007 Publisher: Cairo, Egypt : Hindawi Pub. Corp.,

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Periodical
Applied surface science
Authors: ---
ISSN: 01694332 18735584 Publisher: Amsterdam


Periodical
Tribology international
ISSN: 0301679X 18792464 Year: 1974 Publisher: [Guildford, Surrey : IPC Science and Technology Press],

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" ... provides up-to-date information on the science, practice and technology of lubrication, wear prevention and friction control. This multidisciplinary field is approached from a practical standpoint, equipping designers, research and development engineers, mechanical and lubrication engineers, managers and scientists with the information that will enable them to minimize the cost of moving parts. Thus machinery can be made more efficient, more reliable and more cost effective."


Periodical
Surface engineering and applied electrochemistry.
Author:
ISSN: 19348002 10683755 Year: 1993 Publisher: [New York] : Jersey City, NJ : Allerton Press Springer Nature

Handbook of Microscopy for Nanotechnology
Authors: ---
ISBN: 1402080034 9786610625352 1615833757 128062535X 1402080069 Year: 2005 Publisher: Boston, MA : Springer US,

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Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

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